Symposium 2017

The 3rd International Symposium on Analytical Methods in Philately was held in London in 2017. For those that could not make it, the presentations are here.

Full Symposium: Proceedings of the Third International Symposium on Analytical Methods in Philately

Full schedule With Abstracts

Program Overview, Introductions

Speaker Bios

The presentations given at the The 3rd International Symposium on Analytical Methods in Philately are below:

• The World of Micro-XRF - A Nondestructive Method to Reveal Details in Different Fields of Applications
  (Andreas Wittkopp, Bruker Nano GmbH, Berlin)
  
  
• Beware the Certainties of Science
  (Christopher Harman RDP, Hon. FRPSL Chairman)
  
  
• Impact of Technical Analyses on Greene Foundation Expertizing
  (Ted Nixon and Garfield Portch)
  
  
• A Versatile Comparison of Stamps by High Resolution Image Differencing
  (Robert V. Mustacich, Ph.D.)
  
  
• Forensic Philately in 2020. Challenges and Opportunities
  (Professor Paul Leonard BSc. (Hons.), CSci., FRPSL)
  
  
• The Use of Tonal Histograms for the Study of Stamp Shades
  (Tim Lyerla)
  
  
• Nondesctructive Analyses: Creating Standards For Imperial Brazilian Stamps From A Case Study Of Cottons Essays
  (Fernando Silva Moreira dos Santos)
  
  
• United States 24¢ Purple 1870-1875, Progress Report on a Philatelic Enigma
  (John Barwis and Harry Brittain)
  
  
• Chemistry of Aniline inks, 2-cent Admiral Issues of Canada
  (Richard Judge)
  
  
• The Colors of the Germany Crown and Eagle Series, Objectifying Their Classification by Color
  (John M. Cibulskis, Ph.D.)
  
  
• Using the Bruker XRF to Distinguish the Six Different Printings of the U.S. Newspaper Stamp Designs N4 and N5
  (Larry Lyons)
  
  
• Exploring Color Mysteries in the United States Large and Small Numeral Postage Due Stamps Using X-ray Fluorescence Spectrometry
  (Harry K. Charles, Jr., Ph. D.)