Symposium 2012

The First International Symposium on Analytical Methods in Philately is now history. It was an incredible opportunity for 50 philatelists to meet, hear papers on many interesting subjects and get hands-on experience with equipment in the NPM laboratory.

Sold-out audience listens to one of 19 technical presentations.

• Abstracts of Symposium Papers (PDF)
• Symposium Program (PDF)
• Symposium Evaluation Summary (PDF)
• Proceedings of the First International Symposium on Analytical Methods in Philately (PDF)
  (Edited by Thomas Lera, John H. Barwis, and David L. Herendeen)

Some of the presentations given at the First International Symposium are below:

• Using XRF for Philatelic Analysis
  (Dr. B. Kaiser)
  
  
• A Comparative Study of Security Measures Used by Security Printers
  (G. Portch and C. Verge)
  
  
• Comprehensive Forensic Investigation of Three Great Britain 1d Plate 77 Stamps on Cover
  (A. H. Najjar)
  
  
• Reflectance Spectra of Colored Overprints
  (Dr. L. Caswell)
  
  
• New Ways of Looking at Pre-philatelic Inks
  (Dr. D. Bortfeldt)
  
  
• Application of PIXE Analysis to Philately
  (Prof. Thomas Gill)
  
  
• Statistical Estimates of Rare Stamp Populations
  (D. L. Herendeen and G. C. White)
  
  
• Documenting Science in the Philatelic Literature
  (D. L. Herendeen)
  
  
• A Layman's Forensic Adventure
  (R. H. Cipolla)
  
  
• Analytical Philately of the London Printings of Chile 1853-1862
  (T. Lera and J. Giaccai)
  
  
• A Forensic Study of the Ink and Paper of the Typographed 1862 5c Blue CSA Stamps
  (Dr. H. G. Brittain)
  
  
• New Ways of Looking at Pre-Philatelic Inks
  Dr. Dieter Bortfeldt (Colombia)
  
  
• Security Measures Used by Stamp Printers
  Garfield Portch, FRPSC & Charles J.G. Verge, FRPSC, FRPSL, Vincent Graves Greene Philatelic Research Foundation